astronomy-physicsresearch
nanodeviceflakedetectalign
Register source microscope images to the full_stack coordinate system using SIFT (same-substrate) or Chamfer+DE (cross-substrate) alignment. Use when aligning bottom_part, top_part, or other source images to the full_stack reference image for van der Waals stack detection.
maintainer
caidish
Updated 3/24/2026
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11
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2
quick start
Installation and usage
Register source microscope images to the full_stack coordinate system using SIFT (same-substrate) or Chamfer+DE (cross-substrate) alignment. Use when aligning bottom_part, top_part, or other source images to the full_stack reference image for van der Waals stack detection.
Installation
$ install --globalskills.sh
Usage
Once installed, you can use this skill by running the following command in your terminal:
skills use nanodeviceflakedetectalign